JPH0257701B2 - - Google Patents
Info
- Publication number
- JPH0257701B2 JPH0257701B2 JP61254060A JP25406086A JPH0257701B2 JP H0257701 B2 JPH0257701 B2 JP H0257701B2 JP 61254060 A JP61254060 A JP 61254060A JP 25406086 A JP25406086 A JP 25406086A JP H0257701 B2 JPH0257701 B2 JP H0257701B2
- Authority
- JP
- Japan
- Prior art keywords
- etching
- film
- polycrystalline silicon
- electrode
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Drying Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25406086A JPS6297332A (ja) | 1986-10-24 | 1986-10-24 | Mosトランジスタの製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25406086A JPS6297332A (ja) | 1986-10-24 | 1986-10-24 | Mosトランジスタの製造方法 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16577478A Division JPS5591130A (en) | 1978-12-27 | 1978-12-27 | Production of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6297332A JPS6297332A (ja) | 1987-05-06 |
JPH0257701B2 true JPH0257701B2 (en]) | 1990-12-05 |
Family
ID=17259667
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25406086A Granted JPS6297332A (ja) | 1986-10-24 | 1986-10-24 | Mosトランジスタの製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6297332A (en]) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR910008983B1 (ko) * | 1988-12-20 | 1991-10-26 | 현대전자산업 주식회사 | 비등방성 식각을 이용한 잔유물 제거방법 |
JP2580485Y2 (ja) * | 1991-12-12 | 1998-09-10 | 住友電装株式会社 | ブレーキライニング材の摩耗検知用プローブ |
JP2586563Y2 (ja) * | 1993-02-08 | 1998-12-09 | 住友電装株式会社 | ブレーキライニング材の摩耗検知用プローブ |
JP3227928B2 (ja) * | 1993-08-06 | 2001-11-12 | 住友電装株式会社 | パットウェアインジケータ |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5240978A (en) * | 1975-09-27 | 1977-03-30 | Fujitsu Ltd | Process for production of semiconductor device |
JPS5269583A (en) * | 1975-12-08 | 1977-06-09 | Hitachi Ltd | Manufacture of insulation gate type semiconductor device |
JPS5324277A (en) * | 1976-08-18 | 1978-03-06 | Nec Corp | Semiconductor devic e and its production |
JPS5352384A (en) * | 1976-10-25 | 1978-05-12 | Hitachi Ltd | Electrode formation method |
-
1986
- 1986-10-24 JP JP25406086A patent/JPS6297332A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6297332A (ja) | 1987-05-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100237275B1 (ko) | 홈으로부터 돌출하는 분리 산화물을 갖는 반도체 장치의 제조 방법 | |
JPS6231506B2 (en]) | ||
JPH036820A (ja) | 窒化シリコンの差別的エッチング | |
US6143623A (en) | Method of forming a trench isolation for semiconductor device with lateral projections above substrate | |
JPS63107119A (ja) | ステップ絶縁層を有する集積回路の製造方法 | |
JPH0543287B2 (en]) | ||
JPS6015944A (ja) | 半導体装置 | |
US4775644A (en) | Zero bird-beak oxide isolation scheme for integrated circuits | |
JPS6038832A (ja) | 半導体装置とその製造方法 | |
JPH0257701B2 (en]) | ||
KR910000020B1 (ko) | 반도체장치의 제조방법 | |
JPH03152954A (ja) | 集積misfetデバイス中に電界分離構造及びゲート構造を形成する方法 | |
JPH05849B2 (en]) | ||
JPS6252950B2 (en]) | ||
JPS6080244A (ja) | 半導体装置の素子分離方法 | |
JPH1167890A (ja) | 半導体装置の製造方法 | |
JPS6297376A (ja) | 半導体装置の電極パタ−ン形成方法 | |
JPH06132292A (ja) | 半導体装置及びその製造方法 | |
JPH0661343A (ja) | 半導体装置の製造方法 | |
JPS6142169A (ja) | 半導体装置の製造方法 | |
JPH0567634A (ja) | Mis型半導体装置の製造方法 | |
KR0134859B1 (ko) | 반도체 소자의 콘택홀 형성방법 | |
JPS5950540A (ja) | 半導体装置の製造方法 | |
JP2669160B2 (ja) | 半導体装置の製造方法 | |
JPH0669066B2 (ja) | 半導体装置の製造方法 |